Return Scanning Tunneling Microscope
PRINCIPLE OF THE TOPOGRAFINER
The left (y) and right (x) piezo
drivers scan the tip over and slightly above the specimen surface. The
center (z) piezo is controlled by a servo system to maintain a constant
voltage, and hence a constant vertical separation between the tip and the
surface. An electron multiplier detects the tiny fraction of the tunneling
current which is scattered by the specimen surface. The results of a scan
are shown at the lower right.
Reference: R.D. Young, Physics Today 24, 42 (Nov. 1971).
FIRST SCANNING PROBE IMAGE
Topographic map of a 180-line-per-mm
diffraction-grating replica, obtained with the Topografiner, a noncontacting
field-emission probe developed at NBS.
Reference: R. Young, J. Ward,
and F. Scire, Rev. Sci. Instrum. 43, 999 (1972).

